X-ray detector

ABSTRACT

To reduce quality losses in edge areas of an X-ray image, caused by temperature fluctuations, an X-ray detector ( 1 ) is arranged with a scintillator ( 2 ) for converting X radiation into light and with an active matrix ( 3 ) of pixel readout elements, arranged behind it in the direction of X radiation, in such a manner that the active matrix ( 3 ) is shielded in an optically opaque manner with respect to the scintillator ( 2 ) in at least one edge area ( 6 ) of the cross-over area of the scintillator ( 2 ) and the active matrix ( 3 ); in particular, the optically opaque shielding is suitable for forming a dark reference zone ( 5 ) when the scintillator ( 2 ) is present.

RELATED APPLICATION

This application claims priority from German Patent Application No. 102006 021 046.8, which was filed on May 5, 2006, and is incorporatedherein by reference in its entirety.

TECHNICAL FIELD

The invention relates to a digital X-ray detector comprising ascintillator and an active matrix.

BACKGROUND

X-ray detectors based on active readout matrices, e.g. of amorphoussilicon (a-Si), in front of which a scintillator layer is located, havebeen known for some years. The impinging X radiation is converted intovisible light in the scintillator layer, converted into electricalcharge in light-sensitive pixel elements of the readout matrix andstored spatially resolved. Related technologies also use an active pixelmatrix of amorphous silicon but combined with an X-ray converter (e.g.selenium) which converts the impinging X radiation directly intoelectrical charge. The stored charge is then read out electronically viaan active switching element, converted into digital signals andforwarded to an electronic image processing system. Such X-ray detectorsare frequently constructed as flat-panel detectors.

Many digital X-ray detectors exhibit a power dissipation which producesa steep increase in temperature or thermal fluctuations of the X-raydetector and its components. In general, temperature rises andfluctuations lead to offset patterns and sensitivity differences,especially in edge areas of the X-ray detector. This is mainly caused bytemperature-related widening or shrinking of adhesive at contact pointsbetween the scintillator and the active matrix and leads to a reducedimage quality of X-ray images at the edge areas. The width of thisdisturbance can comprise up to about 100 pixel readout elements from thescintillator edge inward in the direction of the scintillator center.This reduces the meaningfully useful width of an X-ray detector by about3 cm.

Some X-ray detectors have active air or water cooling in order toprevent temperature rises or fluctuations. Such cooling is known, forexample, from JP 11271456 A. It is also known to remove losses in theX-ray image quality, caused by thermal influences, from the image bysubsequent electronic corrections.

In each row of the active matrix, sections are defined which areshielded from the X radiation. In general, this is implemented by theabsence of a scintillator together with X-ray shielding (lead). Thetotality of these shielded sections is designated the so-called darkreference zone (DRZ). Measurement values detected in the dark referencezone, so-called dark values, are used for correcting the remainingsections of the respective rows, that is to say the useful area. Thismethod is known as line noise correction (LNC).

SUMMARY

Quality losses, caused by temperature fluctuations, can be reduced inedge areas of X-ray images in a digital X-ray detector, particularly inan X-ray detector with a dark reference zone.

According to an embodiment, a digital X-ray detector may comprise ascintillator for converting X radiation into light, and an active matrixof pixel readout elements arranged behind the scintillator in thedirection of X radiation, wherein the active matrix is shielded in anoptically opaque manner with respect to the scintillator in at least oneedge area of the cross-over area of said scintillator and the activematrix.

BRIEF DESCRIPTION OF THE DRAWINGS

The embodiments will be explained in greater detail in the text whichfollows by means of diagrammatically represented embodiments in thedrawing without the invention being restricted to these embodiments.

FIG. 1 shows a top view of a conventional scintillator of an X-raydetector;

FIG. 2 shows a side view of the X-ray detector according to FIG. 1;

FIG. 3 shows a side view of an X-ray detector according to an embodimentwith a light-absorbing adhesive layer;

FIG. 4 shows a side view of a further X-ray detector according to anembodiment with a light-absorbing adhesive layer;

FIG. 5 shows a top view of a scintillator of a further X-ray detectoraccording to an embodiment.

DETAILED DESCRIPTION

In the X-ray detector according to an embodiment, temperature-relatedquality losses which are produced, for example, by widening or shrinkingof adhesive at contact points in the edge area, are avoided by the factthat the active matrix is shielded in an optically opaque manner withrespect to the scintillator in at least one edge area of a cross-overarea of the scintillator and the active matrix, particularly in a darkreference zone.

If, according to one embodiment, the area of the scintillator, the areaof the active matrix and the cross-over area of the scintillator and theactive matrix are essentially equal so that the active matrix iscompletely covered by the scintillator, the optically opaque shieldingforms an area which can be used as dark reference zone in a simple andloss-free manner. Or, in other words: in an X-ray detector with a darkreference zone, the critical edge area of the adhesion between activematrix and scintillator is shifted into the dark reference zone and isthus uncritical for the actual X-ray image. Thus, the entire area of theactive matrix, apart from the DRZ, can be used unrestrictedly forimaging without losses in quality.

According to an embodiment, shielding of the scintillator with respectto the incident X radiation is provided in an edge area of thecross-over area of the scintillator and the active matrix.

According to a further embodiment, the active matrix is shielded withrespect to the scintillator by a light-absorbing, particularly black,layer or coating. Such a layer or coating on the top of the activematrix or the underside of the scintillator can be integrated in aparticularly simple manner and with little expenditure into the X-raydetector by being applied, for example, photolithographically.

The light-absorbing layer is advantageously formed by a light-absorbingadhesive. The use of such an adhesive can be integrated with littleexpenditure into a production process of the X-ray detector.

According to a further embodiment, the edge area of the cross-over areaof the scintillator and the active matrix has a width of between 10- and100-times the width of a pixel readout unit. This is advantageous sincethe width within which quality losses mainly occur is between 10 and 100pixel widths. A pixel readout unit generally has a width of about 150μm.

According to a further embodiment, the active matrix is shielded in anoptically opaque manner with respect to the scintillator in two oppositeedge areas, particularly in the low edge areas. A typical dark referencezone provided for line noise correction is formed by two such oppositerow edge areas.

A further advantage is the standardization of the process for producingdetectors with respect to a detector family consisting of X-raydetectors with DRZ also suitable for dynamic applications, so-calledUniversal detectors for radiography and fluoroscopy (URF), and thosewithout DRZ, so-called radiography detectors (RAD). According to theembodiments, uniform scintillators and active matrices and even auniform combination of the two can be used for both variants; the onlydifference is produced by housings which differ in their X-rayshielding. This means a lesser expenditure in the production of theX-ray detectors and thus also a cost saving.

FIG. 1 shows as a section from a conventional X-ray detector 1 a topview of a scintillator 2 with dark reference zone 5 arranged on theside. FIG. 2 also shows a section from the X-ray detector 1 according toFIG. 1 in a side view, showing a part of the housing 8 and a leadshielding 7 in addition to the scintillator 2 and the active matrix 3arranged underneath. The lead shielding 7 is used for shielding Xradiation and, as a result, generates the DRZ 5.

The scintillator 2 which is stabilized, for example, by a thin glasssubstrate 10 on its top ends before the beginning of the DRZ 5 and doesnot extend into the latter. The scintillator 2 and the active matrix 3are connected to one another by an adhesive layer 4. In the edge area 6of the cross-over area between the scintillator 2 and the active matrix3, quality losses are caused in an X-ray image read out of the activematrix 3 due to the temperature fluctuations already described and theresultant artifacts. The DRZ 5 and the edge area 6 of the cross-overarea between the scintillator 2 and the active matrix 3 result in aconsiderable reduction in the usable area of the X-ray detector.

FIG. 3 shows in a side view an X-ray detector 1 according to anembodiment, in which the active matrix 3 is shielded in an opticallyopaque manner by a light-absorbing layer 9 with respect to thescintillator 2 in the edge area 6 of the cross-over area of thescintillator 2 and the active matrix 3. Due to the light-absorbing layer9 and due to the fact that the scintillator 2 extends to the edge of theactive matrix 3, a DRZ 5 is formed which can be used for line noisecorrections. There is a cross-over of the DRZ 5 and the low-quality edgearea 6 of the cross-over area of the scintillator 2 and the activematrix 3 which leads to a larger usable area than in comparableconventional X-ray detectors. To obtain the same unrestrictedly usabledetector area in known comparable X-ray detectors, the DRZ 5, and thusimportant corrections, would have to be omitted. In addition, the DRZ 5is protected against the incident X radiation by X-ray shielding 7 inthe X-ray detector 1 shown in FIG. 3.

The light-absorbing layer 9 or coating can also be provided in the formof a light-absorbing adhesive. The layer or coating is advantageouslyblack for particularly effective shielding or has a spectral sensitivitywhich greatly deviates from the scintillator 2. For example, an enamelcoating which was applied photolithographically can be present.Optically opaque nanoparticles of nonreflective material can also bearranged in the edge area 6 of the cross-over area of the scintillator 2and the active matrix 3 on the active matrix 3.

FIG. 4 shows an X-ray detector 3 in which the lead shielding 7 is shapedin such a manner that it does not shield the edge area 6 of thescintillator 2 against X radiation. In the edge area 6 of the cross-overarea of the scintillator 2 and the active matrix 3, the optically opaquelayer 9 is arranged between the scintillator 2 and the active matrix 3.

FIG. 5 shows illustratively a top view of a scintillator 2 in which ineach case an edge area 6 of the cross-over area between the scintillator2 and the active matrix 3 is formed with an optically opaque layer 9between the scintillator 2 and the active matrix 3 as dark referencezone 5 on a first side 11 and an opposite second side 12.

In the case of dynamic applications, an LNC is indispensable so that theinvention can be applied preferably for X-ray detectors which areprovided for such dynamic applications such as, for example, 3-D imagingby means of a movable C arc and digital subtraction angiography (DSA).

In summary: To reduce quality losses in edge areas of an X-ray image,caused by temperature fluctuations, an X-ray detector is arranged with ascintillator for converting X radiation into light and with an activematrix of pixel readout elements, arranged behind it in the direction ofthe X radiation, in such a manner that the active matrix is shielded inan optically opaque manner with respect to the scintillator in at leastone edge area of the cross-over area of scintillator and active matrix;in particular, the optically opaque shielding is suitable for forming adark reference zone when the scintillator is present.

1. A digital X-ray detector comprising: a scintillator for converting Xradiation into light, and an active matrix of pixel readout elementsarranged behind the scintillator in the direction of X radiation, theactive matrix of pixel readout elements configured to convert light fromthe scintillator into electrical charges from which an X-ray image isgenerated, wherein the active matrix is shielded in an optically opaquemanner by a light-absorbing shielding layer located at a junctionbetween the scintillator and the active matrix in at least one edge areaof a cross-over area of said scintillator and the active matrix.
 2. TheX-ray detector according to claim 1, wherein the area of thescintillator, the area of the active matrix and the cross-over area ofthe scintillator and the active matrix are essentially congruent.
 3. TheX-ray detector according to claim 1, wherein shielding of thescintillator with respect to incident X radiation is provided in theedge area of the cross-over area of the scintillator and the activematrix.
 4. The X-ray detector according to claim 1, wherein thelight-absorbing shielding layer located between the scintillator andactive matrix includes a black layer or coating.
 5. The X-ray detectoraccording to claim 1, wherein the light-absorbing shielding layer isformed by a light-absorbing adhesive.
 6. The X-ray detector according toclaim 1, wherein the edge area of the cross-over area between thescintillator and the active matrix has a width of between 10- and100-times the width of a pixel readout unit.
 7. The X-ray detectoraccording to claim 1, wherein the light-absorbing shielding layer coversat least two opposite edge areas.
 8. A digital X-ray detectorcomprising: a scintillator for converting X radiation into light, anactive matrix of pixel readout elements arranged behind the scintillatorand operable to convert light from the scintillator into electricalcharges from which an X-ray image is generated, and a light-absorbingoptical shield frame arranged at a junction between the scintillator andthe active matrix shielding light in at least one edge area of across-over area of the scintillator and the active matrix.
 9. The X-raydetector according to claim 8, wherein the area of the scintillator, thearea of the active matrix and the cross-over area of the scintillatorand the active matrix are essentially congruent.
 10. The X-ray detectoraccording to claim 8, wherein the light-absorbing optical shield frameextends in the edge area of the cross-over area of the scintillator andthe active matrix.
 11. The X-ray detector according to claim 8, whereinthe light-absorbing optical shield frame is a light-absorbing layer orcoating.
 12. The X-ray detector according to claim 11, wherein thelight-absorbing optical shield frame is black.
 13. The X-ray detectoraccording to claim 11, wherein the light-absorbing layer is formed by alight-absorbing adhesive.
 14. The X-ray detector according to claim 8,wherein the edge area of the cross-over area between the scintillatorand the active matrix has a width of between 10- and 100-times the widthof a pixel readout unit.
 15. The X-ray detector according to claim 8,wherein the active matrix is shielded in an optically opaque manner withrespect to the scintillator in two opposite edge areas.